CSU electron microscopy expert honored for groundbreaking invention

Roy Geiss, an electron microscope expert in the university’s Central Instrument Facility, has been honored by the National Institute of Standards and Technology for his invention of a groundbreaking technique in analytical microscopy.

Roy Geiss
Roy Geiss

Geiss received the Materials Measurement Laboratory Distinguished Associate Accolade for his invention of transmission electron backscattered diffraction, or t-EBSD. Geiss was honored at a June 6 gala in Boulder.

The technique for which he was honored provides a tenfold improvement in the spatial resolution of mapping orientation and structure of crystalline materials, compared with the conventional technique. With this development, Geiss has provided the research community with a powerful tool for characterizing materials used in advanced electronics, nanotechnology and nano-crystalline structural alloys.

Geiss’ research interests include a wide variety of hard and soft materials. He uses transmission electron microscopy and scanning electron microscopy, as well as associated techniques including electron diffraction and energy-dispersive X-ray spectroscopy.

Geiss was previously employed at the National Institute of Standards and Technology as a materials research engineer. He has a doctorate in applied physics from Cornell University, and also served as a research scientist at IBM’s research division before joining CSU’s Central Instrument Facility. The facility is housed in the Department of Chemistry and is a foundational core research facility supported by the Office of the Vice President for Research.